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Active vs. Passive Scanning for Multi-Point Measurement white paper

Manufacturing Group | March 24, 2014

Carl Zeiss Industrial Metrology offers a new white paper explaining the difference between active and passive scanning.

There are two available contact-scanning technologies: passive and active. Passive scanning probe heads use springs to hold the stylus in its neutral position and strain gauges to measure deflection as it is moved by contours of the surface being measured. Active scanning probe heads use software-controlled electromagnets and force controllers in place of springs and strain gauges.

Click here to download the white paper now.

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